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JR - Ocotillo Technology Fabrication (OTF) Yield And Integration Department Manager
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- Experience working with Yield Analysis tools (techniques and systems), Process Engineering knowledge, Process Control, device knowledge, materials analysis techniques and Fault Analysis Layout sensitivities to identify Product Yield issues and drive EOL Yields to Best in Class.
- Knowledge of module tool impacts to defects, inline parametrics and yield through PM life while understanding upstream and downstream impacts to other tools.
- Experience in Process Integration of FINFET, Strained SiGe , Hi K dielectric+Metal Gate, immersion Lithography plus spacer based double and quad patterning, driving continuous improvement projects to achieve Best in Class yielding, reliable products.
- Knowledge of yield analysis techniques and systems, understanding of processing techniques (Lithography, Etch, Implant, CMP, CVD, plating, diffusion, thin films, etc), yield engineering data analysis tools, and working knowledge of semiconductor devices.
- Yield data analytics skill (data query, cleaning/sanity check, preparation, data analysis/statistical method (via JMP), visualization, drawing conclusion).
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