Lead R&D Process Scientist/Metrology - Chemicals & Materials (Saginaw)

Be part of an ever-evolving industry that continues its advancement based on the materials you deliver! GNR has been retained to identify a LEAD / Sr PROCESS SCIENTIST / METROLOGIST for a well-established, internationally known, 50+ year old advanced materials organization.The Company offers:A rewarding & positive culture, offering challenging work & stability. Plus, the company's ongoing expansion & investment.Work with some of the brightest chemists and create some of the most advanced measurement technologies & systems on the planet!Reporting directly to the R&D Metrology Director, you'll play a significant role in the group and mentor team members, coordinate small projects, and expand the boundaries.You should have experience with sophisticated measurement processes & technologies used in any of the following sectors:Chemical ~ Materials ~ Semiconductor ~ Pharma ~ BiotechUse of FTIR & PhotoluminescenceRESPONSIBILITIES & EXPERIENCES SHOULD INCLUDE:8+ years of experience and a deep knowledge in analytical methods, measurement development, validation and qualification for a high-reliability manufacturing environment – ISO 17025.Serve as a subject matter expert & cross-functional leader supporting quality testing, manufacturing operations, new product introduction, and resolving customer issues.Drive METROLOGY technology initiatives and provide key technical input for new equipment & large capital projects.MS / PhD Degree in Material Science, Chemistry or PhysicsUS Citizen / Perm ResidentLOCATION: On-site SAGINAW, MI region (Consider the opportunity before dismissing the location) Mid-size community – great schools, short commutes, lower cost of living, great outdoors, and you can enjoy all 4 seasons!!COMPENSATION: VERY Attractive package = Base + Bonus + robust relocation assistanceKeywords & technologies: Fourier Transform Infrared FTIR & Photoluminescence FTPL, SEMI MF1389 MF1391, ISO17025, trace analysis, chemical analysis, trace element, contaminant identification, measurement system analysis (MSA), ICP-OES, ICP-AES, ICP-MS (Inductively Coupled Plasma), Spectrometry (SIM, TXRF, SEM/EDS, AES, XPS, TOS-SIMS, ), atomic absorption spectroscopy, atomic absorption spectroscopy, Gas Chromatography-Mass Spectrometry,