Components Reliability Engineer

Overview In this role, you ensure the reliability of EEE components used across systems, assessing new and existing parts, analyzing failures, and guiding improvements. You will work closely with design teams and suppliers to embed reliability in products and support long-term performance. The role focuses on predicting reliability, conducting accelerated life tests, and translating findings into actionable design or process changes. You will contribute to MACOM’s commitment to high-quality, reliable semiconductor solutions in critical applications. This is an opportunity to shape component reliability strategies in a fast-paced, cross-functional environment. ResponsibilitiesEvaluate new and existing EEE components for suitability and reliability based on application requirementsInvestigate root causes of component failures and implement corrective actionsUse statistical and probabilistic methods to predict reliability of components and systemsConduct accelerated life tests to simulate operating conditions and assess durabilityCollaborate with design teams to incorporate reliability considerations into the design processCollaborate with suppliers to ensure quality and reliability of EEE componentsCommunicate reliability findings and recommendations to stakeholders Key requirementsBachelor’s or Master’s degree in mechanical, electrical, materials, or aerospace engineering2+ years of reliability engineering, semiconductor physics, or related field experienceStrong understanding of EEE components, semiconductor physics, and failure mechanismsAnalytical data analysis and pattern recognition abilitiesProblem-solving skills and ability to troubleshoot failuresExcellent communication skills for technical and non-technical audiencesExperience with CAD, CAE, and reliability analysis softwareProject management skills (timelines, budgets, resources)CRE or related certifications may be beneficialEffective communicationProblem-solvingAnalytical thinkingEEE components knowledgeSemiconductor physicsFailure mechanisms