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Intern - Metrology Process Development Engineer
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Full-time
- Do you have experience with Optical films, overlay, electrical, x-ray, profiling, and other physical characterization methods?
- We are the lifeblood of Micron's technology development, providing in-fab data that quantifies the statistics of every process used to make the memory chips that are powering the mobile devices, data centers, autonomous cars, internet of things, and of course personal computers in use across the globe.
- In Metrology, we work on projects meaningful to current and future semiconductor manufacturing needs.
- Projects may include focus on one or more of disciplines within the metrology group; Optical Thin Films, Scatterometry/OCD, X-Ray, Overlay/Registration, Profiling/Topography, FIB, or CDSEM.
- Analyze top-down and cross-sectional semiconductor structure metrology data using Excel and JMP.
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